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FEI CM200

Overview

Technical Features

Example Results

Images

The Philips/FEI CM200 is a 200kV Transmission Electron Microscope with a LaB6 filament with a 0.27 nm Scherzer point resolution. It has a twin objective lens, and a goniometer allowing for ± 80° alpha tilt.

This microscope is optimized for defect (e.g., diffraction contrast) and crystallographic (e.g., CBED) work. It includes a light element UTW EDS detector, and has a nanoprobe operational mode for both diffraction and EDS work with approximately 10nm analytical and diffraction limit. It also includes a video camera for dynamic experiments. It will also be upgraded shortly to include a Gatan PEELS detector and 1kx1k CCD detector.

Features of CM200 includes:

A GATAN GIF, fitted with a 1kx1k CCD camera (installation to be completed shortly)
An EDAX™ ultra-thin window X-ray detector
On-line and off-line analysis of EDS spectrums (EDAX™ Genesis)
A single hot-stage (up to 1000°C) and two cryo-stages.

Facility And Equipment Details