The Strata DB235 FIB is the workhorse of CAMM for site-specific TEM sample preparation. This microscope was the first of its kind installed in academia and has been used to prepare TEM membranes as well as develop Slice and View technology for creating data sets serially through a volume of material. The DB235 has been upgraded over the years and is currently equipped with a high resolution field-emission scanning electron microscope (SEM) and a Magnum Column focused ion beam (FIB) for etching and Pt deposition. These beams may be used in a number of different capacities such as high resolution thru-lens backscattered electron imaging for phase contrast characterization or secondary ion imaging for grain contrast. CAMM also has Software programs such as Slice and View™ that performs automated collection of data serially through a volume for visual representation, as well as 3D-reconstruction.
Site-specific TEM is the primary use of this instrument in CAMM and in situ plucking is possible with the use of an OMNIProbe in-situ micromanipulator. Chemical analysis is also possible with use of the EDAX analysis equipment.

While this FIB is mainly used for site-specific TEM preparation, it is also used for:
• Serial sectioning of structural alloys for 3-D micro-structural representation
• Machining atomic force microscopy (AFM) samples that require a radius of curvature less than 100 nm at the tip
• Machining of pillars from bulk material to investigate size scale effects through compression
• Fabrication of low resistance connections between nanowires for nanoelectronic devices

CAMM DB235

• SFEG Analytical Electron Column
  • Thru-Lens Detector
  • Custom BSD
• Magnum Ion Column (Ga+)
  
• Pt GIS
  
• Omniprobe for in-situ plucking of TEM specimen
  
• EDAX EDS analysis equipment
  
• TSL OIM Camera (max speed 50 fps)
  
• Software
  
  • Slice and View
    
  • AutoTEM
    
  • AutoFIB
    
  • RunScript