The Center For The Accelerated Maturation of Materials

Accelerated Metals Development by Computation Experimental and Computational Tools for the Digital Representation and Prediction of Microstructure and its Incorporation in the Designer’s Knowledge Base Microstructural and Mechanical Property Model Development for Wrought Titanium Alloys Advanced Ti Alloys Applications for Affordability Visualization, Imaging and Modeling: Shared Instrumentation in Materials Research and Education Phase Stabilities in Nano-scaled Metallic Multilayers Powder Metallurgy Processing Accelerated Development of Titanium Alloys for Implant Applications Automated and Accelerated Characterization of Nano-scaled Particulate Probing the Early Stages of Second Phase Nucleation and Phase Separation in Titanium Alloys

Characterization at the Nano-scale for Undergraduate and High School Students CAMM (High School) Intern Research Program Undergraduate Research in CAMM

Industrial Partnerships Consulting Services

Sino-US Partnership in Materials Research and Education Indo-US Partnership on the Influence of Reduced Dimensions on the Structure and Properties of Nanocomposite Thin Films CAMM's Partnership with the ARC Centre of Excellence for Design in Light Metals at Monash University, Australia CAMM’s Partnership with the IRC at the University of Birmingham (UK)

MSE 663

FEI Nova (with EBSD)

Overview

Specifications

Example Results

References
And Papers

Images

The Nova 600 NanoLab with Sidewinder Ion Column is a prototype developed by FEI as a result of collaboration with CAMM and other researchers in an effort to provide a streamlined approach to serial section data collection in combination with crystallographic orientation.

FEI Sirion S-FEG column

Thru-Lens Detector
Custom BSD

Sidewinder Ion Column

Single isotope Ga+ LMIS provides better resolution over previous sources
Improved optics over Magnum column; increase milling rate and precision allowing for sectioned volumes to be increased
Variable voltage (2 – 30 kV) LMIS allows for low voltage milling and removal of amorphous/redeposition artifacts for HRTEM sample preparation

Pt GIS
HKL Olympus EBSD Camera (max 100 fps)
End Point Detection

Software

EBS3 (an automated 3-D EBSD collection package)
AutoReveal
AutoTEM
Slice and View
RunScript