The Center For The Accelerated Maturation of Materials

Accelerated Metals Development by Computation Experimental and Computational Tools for the Digital Representation and Prediction of Microstructure and its Incorporation in the Designer’s Knowledge Base Microstructural and Mechanical Property Model Development for Wrought Titanium Alloys Advanced Ti Alloys Applications for Affordability Visualization, Imaging and Modeling: Shared Instrumentation in Materials Research and Education Phase Stabilities in Nano-scaled Metallic Multilayers Powder Metallurgy Processing Accelerated Development of Titanium Alloys for Implant Applications Automated and Accelerated Characterization of Nano-scaled Particulate Probing the Early Stages of Second Phase Nucleation and Phase Separation in Titanium Alloys

Characterization at the Nano-scale for Undergraduate and High School Students CAMM (High School) Intern Research Program Undergraduate Research in CAMM

Industrial Partnerships Consulting Services

Sino-US Partnership in Materials Research and Education Indo-US Partnership on the Influence of Reduced Dimensions on the Structure and Properties of Nanocomposite Thin Films CAMM's Partnership with the ARC Centre of Excellence for Design in Light Metals at Monash University, Australia CAMM’s Partnership with the IRC at the University of Birmingham (UK)

MSE ____ MSE ____

FEI Quanta (with EBSD)

Overview

Specifications

Example Results

Images

This scanning electron microscope (SEM) is a workhorse for general purpose SEM imaging and analysis, and is also used extensively for undergraduate teaching. There are no knobs or switches for this SEM. It is easily controlled through a computer interface using a scroll wheel mouse and a few keyboard shortcuts.

The Quanta has a heated tungsten (W) filament electron source. It can operate in High Vacuum (HV), Low Vacuum (LV) and Environmental SEM (ESEM) modes. These three modes of operation reflect progressively higher specimen chamber pressures.

Electron Gun: Heated tungsten (W) filament
Operating Voltage:
Resolution:
Magnification:

Image media: Digital storage

Detectors:

Everhart Thornley Secondary Electron Detector(ETD)
Back Scattered Electron Detector (BSD)
Energy Dispersive Spectrometer (EDS)
Charge Coupled Detector (CCD)
TSL electrons back scatter diffraction (EBSD) pattern collection for orientation microscopy (OM) and phase identification