The Center For The Accelerated Maturation of Materials

Accelerated Metals Development by Computation Experimental and Computational Tools for the Digital Representation and Prediction of Microstructure and its Incorporation in the Designer’s Knowledge Base Microstructural and Mechanical Property Model Development for Wrought Titanium Alloys Advanced Ti Alloys Applications for Affordability Visualization, Imaging and Modeling: Shared Instrumentation in Materials Research and Education Phase Stabilities in Nano-scaled Metallic Multilayers Powder Metallurgy Processing Accelerated Development of Titanium Alloys for Implant Applications Automated and Accelerated Characterization of Nano-scaled Particulate Probing the Early Stages of Second Phase Nucleation and Phase Separation in Titanium Alloys

Characterization at the Nano-scale for Undergraduate and High School Students CAMM (High School) Intern Research Program Undergraduate Research in CAMM

Industrial Partnerships Consulting Services

Sino-US Partnership in Materials Research and Education Indo-US Partnership on the Influence of Reduced Dimensions on the Structure and Properties of Nanocomposite Thin Films CAMM's Partnership with the ARC Centre of Excellence for Design in Light Metals at Monash University, Australia CAMM’s Partnership with the IRC at the University of Birmingham (UK)

MSE ____ MSE ____

FEI Sirion

Overview

Specifications

Example Results

Images

The SirionTM scanning electron microscope (SEM) is a state of the art high resolution research instrument. It is routinely used to image specimens at very high magnification. This is accomplished using a field emission electron gun (FEG) and a special type of electron detector built inside the final lens. The unique electron collecting efficiency of this detector allows the Sirion to obtain startling high resolution images even at low accelerating voltages.

Electron Source: Field Emission Gun
Operating Voltage:
Resolution:
Magnification:
Image media: Digital storage, Video printer
Image Resolution – 3872x2904 = 11.24 Mega pixels
Image depth – 8 bits/channel

Detectors:

Back Scattered Electron Detector (BSE)
Everhart –Thornley Secondary Electron Detector (SE)
Energy Dispersive Spectrometer (EDS)
Charge - Coupled Detector (CCD)
Through - the - Lens Detector (TLD)

Back scattered image of LENS™ deposited Ti-35Nb-7Zr-9Ta + 2B composite

Back scattered image of Nickel base super alloys Rene N5. Images shows g’ precipitates in g matrix