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FEI Tecnai

Overview

Technical Features

Facility and
Equipment Details

Example Results

Tecnai Images

The FEI TECNAI TF20 is a 200kV Field Emission Gun Transmission Electron Microscope, which was installed in 2003. One of the important features of this microscope is its X-twin objective lens with Cs of 1.3mm, which increase the collection efficiency of X-ray analysis, and makes TECNAI a powerful analytical tool for STEM-EDS applications.

Other features currently available on this microscope are Lorentz lens for field free applications, GIF for EFTEM, EELS and ELNES experiments and HRTEM imaging. TECNAI has a point resolution of 0.25nm and information limit of 0.14nm. The spatial resolution in the STEM mode is 0.18nm.

The TECNAI TF20 is located in a room with a x-y-z Field Compensation System to minimize the effect of electromagnetic fields.

Features of TECNAI TF20 includes:

A GATAN GIF, fitted with a 1kx1k CCD camera
Fischione Tomography holder with software for the automated collection of tomographic series
On-axis Fischione High Angle Annular Dark Field (HAADF) detector
An EDAX ultra-thin window X-ray detector
Integrated Software for automated collection of STEM EDS line profiles and mapping
On-line and off-line analysis