

Arda's main focus in research is application and development of Advanced Transmission Electron Microscopy (ATEM) techniques such as electron energy-loss spectroscopy (EELS), scanning transmission electron microscopy (STEM) and high-resolution electron microscopy (HRTEM). His work also includes deposition and characterization of metallic thin films by UHV magnetron sputtering for various applications.
Recently, he has been working on quantum confinement (QC) effect in nanocrystal thin films and microstructure and electronic property characterization of these nanocrystals by using EELS and HRTEM. Since, nanocrystals show interesting electronic properties, strongly influenced by the size of the nanocrystal. Common belief, if the nanocrystal size is reduced under a critical value (< 1-2 nm), electronic properties of the crystal changes, nanocrystal loses its electric conductivity and becomes an insulator. All these interesting features can be examined by the detailed analysis of surface, bulk plasmons and certain characteristic of ionization edges in the EEL spectrum. These materials may be good future candidates for the ultra-low dielectric applications in the electronic industry.